By Rik Brydson
The ebook is anxious with the speculation, heritage, and sensible use of transmission electron microscopes with lens correctors that may right the results of round aberration. The publication additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technological know-how and biology. This publication is vital for microscopists fascinated about nanoscale and fabrics microanalysis in particular these utilizing scanning transmission electron microscopy, and comparable analytical strategies corresponding to electron diffraction x-ray spectrometry (EDXS) and electron strength loss spectroscopy (EELS).
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Additional info for Aberration-corrected Analytical Electron Microscopy
So techniques have evolved to make progress with important problems such as the structure of catalyst particles, or of grain boundaries in the solid state, without the acquisition of a surfeit of data. Even so, it is difficult to extract both spectral information and structural information simultaneously. Early attempts to do this used a mechanical slit to select a line in the image of the sample from which energy-loss spectra could be obtained (Metherell and Whelan, 1965). The main problem with this method was mechanical construction and control of the slit.
A weak phase object is a specimen so thin that the electron beam passing thorough it only suffers a modest phase shift, while its amplitude remains effectively unchanged. The approximation that a specimen is indeed a weak phase object is important for much of the treatment in Chapter 5. It should be obvious that such a specimen must be substantially thinner than the mean free path for all the inelastic scattering processes. In practice many biological specimens will meet this criterion at thicknesses below 50 nm, but specimens containing substantially heavier atoms would need to be much thinner.
Such an ambitious programme has not yet been carried out in practice, for a variety of reasons. But it is instructive to think of the amount of information required. In a particle of size 30 nm, there are typically a million atoms. 1%. The total information required is a minimum of 1016 bits, say 1 Tbyte. Even if the problems of mechanical stability and radiation damage in the microscope could be overcome, the problem of handling the data is formidable, requiring processing speeds and random access memories perhaps a hundred times greater than those now routinely available.